Research Facilities

Atomic force microscopy systems (Park Systems, XE-100 & NX10)

- Glove box to control the ambient

- Sample temperature stage w/ a Peltier device

- PCB board for simultaneous electrical characterizations

- LED light sources w/ polarizers

Micro-fabrication equipment in a clean room

- Mask aligner

- Wet station

- Optical microscope (Nikon)

- Surface profilometer (Dektak)

- Reactive ion etcher (SBT RIE2000)

- Electron-beam evaporator (Telemark)

- RF magnetron sputterer

Dry transfer set-ups for 2D materials

Probe station w/ a hot chuck (Instek)

Variable-temperature vacuum probe station (Janis ST-500)

- Semiconductor characterization system (Keithley 4200)

- Digital oscilloscope (Tektronix DPO4104)

- Sourcemeter (Keithley 2400)

Micro-Raman/PL system (Nanobase)

- 532 and 633 nm lasers (Cobolt)

- Scanning photocurrent mapping

Angle-resolved reflectance measurement setup

Wire bonder (Westbond)

Workstation for FDTD simulations (Lumerical)